Patent risk evaluation in international trade based on the analytic hierarchy process and entropy method

Ben Zhang; Lei Ma; Zheng Liu; Fuxin Wang

Patent risk evaluation in international trade based on the analytic hierarchy process and entropy method

Ben Zhang, Lei Ma, Zheng Liu, Fuxin Wang

Research output: Contribution to conference › Abstract › peer-review

Original language	English
Publication status	Accepted/In press - 28 Jan 2019
Event	SOItmC (Society of Open Innovation, Technology, Market & Complexity) & Meijo University 2019 Conference : Second IT Revolution, and Dynamic Open Innovation; From Smart City, Autonomous Car, Intelligent Robot, and Block Chain to Sharing Economy - Meijo University, Nagoya, Japan Duration: 28 Jun 2019 → 1 Jul 2019 http://openinnovation-tmc.org/HOME/soitmc/sub/sub.htm?nav_code=soi1531366632

Conference

Conference	SOItmC (Society of Open Innovation, Technology, Market & Complexity) & Meijo University 2019 Conference
Abbreviated title	SOItmC2019
Country/Territory	Japan
City	Nagoya
Period	28/06/19 → 1/07/19
Internet address	http://openinnovation-tmc.org/HOME/soitmc/sub/sub.htm?nav_code=soi1531366632

Society of Open Innovation: Technology, Market & Complexity & Meijo University Conference 2019 (SOItmC 2019)
Zheng Liu (Speaker)
Jun 2017 → …
Activity: Participating in or organising an event › Participation in conference

Cite this

@conference{4601a5d11ace4b63af9bd6c6ff696dde,

title = "Patent risk evaluation in international trade based on the analytic hierarchy process and entropy method",

author = "Ben Zhang and Lei Ma and Zheng Liu and Fuxin Wang",

year = "2019",

month = jan,

day = "28",

language = "English",

note = "SOItmC (Society of Open Innovation, Technology, Market & Complexity) & Meijo University 2019 Conference : Second IT Revolution, and Dynamic Open Innovation; From Smart City, Autonomous Car, Intelligent Robot, and Block Chain to Sharing Economy, SOItmC2019 ; Conference date: 28-06-2019 Through 01-07-2019",

url = "http://openinnovation-tmc.org/HOME/soitmc/sub/sub.htm?nav_code=soi1531366632",

}

TY - CONF

T1 - Patent risk evaluation in international trade based on the analytic hierarchy process and entropy method

AU - Zhang, Ben

AU - Ma, Lei

AU - Liu, Zheng

AU - Wang, Fuxin

PY - 2019/1/28

Y1 - 2019/1/28

M3 - Abstract

T2 - SOItmC (Society of Open Innovation, Technology, Market & Complexity) & Meijo University 2019 Conference

Y2 - 28 June 2019 through 1 July 2019

ER -

Patent risk evaluation in international trade based on the analytic hierarchy process and entropy method

Conference

Activities

Society of Open Innovation: Technology, Market & Complexity & Meijo University Conference 2019 (SOItmC 2019)

Cite this