Modelling of an Integrated Quality System Using IDEFO

Hefin Rowlands; C. Richards

Modelling of an Integrated Quality System Using IDEFO

Hefin Rowlands, C. Richards

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

This paper investigates issues relating to quality and quality strategy and outlines a framework for a quality system which integrates people, technology and methods to enable businesses to benefit from the synergy provided in bringing these aspect together. IT
has an important part to play in the realisation of the concept. A modelling method based on IDEFO is examined and a case study presented where IDEFO is used to model a semiconductor manufacturing process.

Original language	English
Title of host publication	Industrial Electronics, 2002
Subtitle of host publication	ISIE 2002. Proceedings of the 2002 IEEE International Symposium on
Publisher	Institute of Electrical and Electronics Engineers
Pages	1364-1369
Volume	4
Publication status	Published - 2002
Event	IEEE International Symposium on Industrial Electronics - L'Aquila, Italy Duration: 8 Jul 2002 → 11 Jul 2002

Conference

Conference	IEEE International Symposium on Industrial Electronics
Country/Territory	Italy
City	L'Aquila
Period	8/07/02 → 11/07/02

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http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=1025990Licence: CC BY-NC-ND

Cite this

@inproceedings{7d3a189e74d64e0091c8759b46157bdb,

title = "Modelling of an Integrated Quality System Using IDEFO",

abstract = "This paper investigates issues relating to quality and quality strategy and outlines a framework for a quality system which integrates people, technology and methods to enable businesses to benefit from the synergy provided in bringing these aspect together. IThas an important part to play in the realisation of the concept. A modelling method based on IDEFO is examined and a case study presented where IDEFO is used to model a semiconductor manufacturing process. ",

author = "Hefin Rowlands and C. Richards",

year = "2002",

language = "English",

volume = "4",

pages = "1364--1369",

booktitle = "Industrial Electronics, 2002",

publisher = "Institute of Electrical and Electronics Engineers",

note = "IEEE International Symposium on Industrial Electronics ; Conference date: 08-07-2002 Through 11-07-2002",

}

Rowlands, H & Richards, C 2002, Modelling of an Integrated Quality System Using IDEFO. in Industrial Electronics, 2002: ISIE 2002. Proceedings of the 2002 IEEE International Symposium on. vol. 4, 1025990, Institute of Electrical and Electronics Engineers, pp. 1364-1369, IEEE International Symposium on Industrial Electronics, L'Aquila, Italy, 8/07/02. <http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=1025990>

Modelling of an Integrated Quality System Using IDEFO. / Rowlands, Hefin; Richards, C.
Industrial Electronics, 2002: ISIE 2002. Proceedings of the 2002 IEEE International Symposium on. Vol. 4 Institute of Electrical and Electronics Engineers, 2002. p. 1364-1369 1025990.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Modelling of an Integrated Quality System Using IDEFO

AU - Rowlands, Hefin

AU - Richards, C.

PY - 2002

Y1 - 2002

N2 - This paper investigates issues relating to quality and quality strategy and outlines a framework for a quality system which integrates people, technology and methods to enable businesses to benefit from the synergy provided in bringing these aspect together. IThas an important part to play in the realisation of the concept. A modelling method based on IDEFO is examined and a case study presented where IDEFO is used to model a semiconductor manufacturing process.

AB - This paper investigates issues relating to quality and quality strategy and outlines a framework for a quality system which integrates people, technology and methods to enable businesses to benefit from the synergy provided in bringing these aspect together. IThas an important part to play in the realisation of the concept. A modelling method based on IDEFO is examined and a case study presented where IDEFO is used to model a semiconductor manufacturing process.

M3 - Conference contribution

VL - 4

SP - 1364

EP - 1369

BT - Industrial Electronics, 2002

PB - Institute of Electrical and Electronics Engineers

T2 - IEEE International Symposium on Industrial Electronics

Y2 - 8 July 2002 through 11 July 2002

ER -

Modelling of an Integrated Quality System Using IDEFO

Abstract

Conference

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Cite this