Low Cost Microprocessor Controlled A.T.E. for White Consumer Products Testing

Hefin Rowlands*, J. Hywel Williams

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Abstract

    This paper outlines the design and development of a microprocessor controlled A. T. E. for an automatic washing machine. A large section of the work involved designing a high level test language to provide the test engineer with the facility to alter program parameters. Its format is such that any system under test requiring both analog and digital monitoring can be accommodated.

    Original languageEnglish
    Title of host publicationAutomatic Testing & Test and Measurement Exhibition 83, Conference Proceedings. Session 5: Production Testing and Testability.; Wiesbaden, W Ger; ; Code 5054
    PublisherNetwork Exhibitions Ltd
    Pages49-54
    Number of pages6
    ISBN (Print)0907634176
    Publication statusPublished - 1 Dec 1983

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