Development of a Hardware for Frequency Scanning Interferometry for Long Range Measurement'

Research output: Contribution to conferencePaperpeer-review

17 Downloads (Pure)

Abstract

The advancement in optical technology based metrology has been significant over recent years. Many applications utilize the Frequency Scanning Interferometry (FSI) technique for short and long-range precision measurements. This paper discusses the design and development of a cost-effective FPGA based data acquisition solution for FSI system for long-range measurement. The proposed hardware uses the 160MS/s ADC interfaced with an FPGA via an LVDS interface. The acquisition hardware utilizes the external clock signal generated from the reference interferometer which reduces the non-linear effect of the tunable laser for improved precision. The design and development of a low noise comparator design for an external sampling clock is also presented.
Original languageEnglish
Pages1-6
Number of pages6
Publication statusAccepted/In press - 25 Feb 2022
EventIEEE The International Instrumentation & Measurement Technology Conference (2022) - Canada, Ottawa
Duration: 16 Apr 202219 Apr 2022
https://i2mtc2022.ieee-ims.org/

Conference

ConferenceIEEE The International Instrumentation & Measurement Technology Conference (2022)
CityOttawa
Period16/04/2219/04/22
Internet address

Fingerprint

Dive into the research topics of 'Development of a Hardware for Frequency Scanning Interferometry for Long Range Measurement''. Together they form a unique fingerprint.

Cite this