Development of a Hardware for Frequency Scanning Interferometry for Long Range Measurement'

Sivagunalan Sivanathan, Ali Roula, Nigel Copner, Bethan Copner

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Abstract

The advancement in optical technology based metrology has been significant over recent years. Many applications utilize the Frequency Scanning Interferometry (FSI) technique for short and long-range precision measurements. This paper discusses the design and development of a cost-effective FPGA based data acquisition solution for FSI system for long-range measurement. The proposed hardware uses the 160MS/s ADC interfaced with an FPGA via an LVDS interface. The acquisition hardware utilizes the external clock signal generated from the reference interferometer which reduces the non-linear effect of the tunable laser for improved precision. The design and development of a low noise comparator design for an external sampling clock is also presented.
Original languageEnglish
Pages1-6
Number of pages6
Publication statusPublished - 25 May 2022
EventIEEE The International Instrumentation & Measurement Technology Conference (2022) - Canada, Ottawa
Duration: 16 Apr 202219 Apr 2022
https://i2mtc2022.ieee-ims.org/

Conference

ConferenceIEEE The International Instrumentation & Measurement Technology Conference (2022)
CityOttawa
Period16/04/2219/04/22
Internet address

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