Patent risk evaluation in international trade based on the analytic hierarchy process and entropy method

Ben Zhang, Lei Ma, Zheng Liu, Fuxin Wang

    Allbwn ymchwil: Cyfraniad at gynhadleddCrynodebadolygiad gan gymheiriaid

    Cynhadledd

    CynhadleddSOItmC (Society of Open Innovation, Technology, Market & Complexity) & Meijo University 2019 Conference
    Teitl crynoSOItmC2019
    Gwlad/TiriogaethSiapan
    DinasNagoya
    Cyfnod28/06/191/07/19
    Cyfeiriad rhyngrwyd

    Dyfynnu hyn