Mitigating the Effect of Obstacles in Narrowband Ultrasonic Localization Systems

Sebastian Haigh, Janusz Kulon, Adam Partlow, Paul Rogers, Colin Gibson

Allbwn ymchwil: Pennod mewn Llyfr/Adroddiad/Trafodion CynhadleddCyfraniad i gynhadleddadolygiad gan gymheiriaid

4 Wedi eu Llwytho i Lawr (Pure)

Crynodeb

This paper develops a method for mitigating the negative effects of obstacles in narrowband, time division multiple access (TDMA), ultrasonic localization systems. The method builds upon the robust Bayesian classifier for ultrasonic localization (RoBCUL) algorithm which utilizes an iteratively reweighted least squares (IRLS) scheme. This algorithm has the advantage of low computational cost but loses performance in the presence of obstacles. The improved version of the RoBCUL algorithm presented in this paper uses a statistical test applied after each iteration of the regression, using a weighted residual vector calculated from the weight matrix and residual vector. The technique was tested using experimental data with its performance being quantified by its ability to correctly classify all the signals received during a single TDMA cycle. The extended version performed significantly better in all obstacle scenarios than the original, correctly classifying 100% of TDMA cycles in the scenarios with no obstacles, 97.6% with one obstacle, and 89.0% with two obstacles.
Iaith wreiddiolSaesneg
TeitlProceedings of the 2019 IEEE International Instrumentation & Measurement Technology Conference
Is-deitlThe Lords of the IMS - Expanding the Frontiers of Metrology Innovations 20/05/19 → 23/05/19 Auckland, New Zealand
CyhoeddwrInstitute of Electrical and Electronics Engineers
Nifer y tudalennau5
ISBN (Electronig)978-1-5386-3460-8, 978-1-5386-3461-5
Dynodwyr Gwrthrych Digidol (DOIs)
StatwsCyhoeddwyd - 9 Medi 2019
Digwyddiad2019 IEEE International Instrumentation & Measurement Technology Conference : The Lords of the IMS - Expanding the Frontiers of Metrology Innovations - Grand Millennium Auckland , Auckland, Seland Newydd
Hyd: 20 May 201923 May 2019
https://i2mtc2019.ieee-ims.org/

Cyfres gyhoeddiadau

Enw
ISSN (Electronig)2642-2077

Cynhadledd

Cynhadledd2019 IEEE International Instrumentation & Measurement Technology Conference
Teitl crynoIEEE I2MTC 2019
Gwlad/TiriogaethSeland Newydd
DinasAuckland
Cyfnod20/05/1923/05/19
Cyfeiriad rhyngrwyd

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