Mitigating the Effect of Obstacles in Narrowband Ultrasonic Localization Systems

Sebastian Haigh, Janusz Kulon, Adam Partlow, Paul Rogers, Colin Gibson

    Allbwn ymchwil: Pennod mewn Llyfr/Adroddiad/Trafodion CynhadleddCyfraniad i gynhadleddadolygiad gan gymheiriaid

    14 Wedi eu Llwytho i Lawr (Pure)

    Crynodeb

    This paper develops a method for mitigating the negative effects of obstacles in narrowband, time division multiple access (TDMA), ultrasonic localization systems. The method builds upon the robust Bayesian classifier for ultrasonic localization (RoBCUL) algorithm which utilizes an iteratively reweighted least squares (IRLS) scheme. This algorithm has the advantage of low computational cost but loses performance in the presence of obstacles. The improved version of the RoBCUL algorithm presented in this paper uses a statistical test applied after each iteration of the regression, using a weighted residual vector calculated from the weight matrix and residual vector. The technique was tested using experimental data with its performance being quantified by its ability to correctly classify all the signals received during a single TDMA cycle. The extended version performed significantly better in all obstacle scenarios than the original, correctly classifying 100% of TDMA cycles in the scenarios with no obstacles, 97.6% with one obstacle, and 89.0% with two obstacles.
    Iaith wreiddiolSaesneg
    TeitlProceedings of the 2019 IEEE International Instrumentation & Measurement Technology Conference
    Is-deitlThe Lords of the IMS - Expanding the Frontiers of Metrology Innovations 20/05/19 → 23/05/19 Auckland, New Zealand
    CyhoeddwrInstitute of Electrical and Electronics Engineers
    Nifer y tudalennau5
    ISBN (Electronig)978-1-5386-3460-8, 978-1-5386-3461-5
    Dynodwyr Gwrthrych Digidol (DOIs)
    StatwsCyhoeddwyd - 9 Medi 2019
    Digwyddiad2019 IEEE International Instrumentation & Measurement Technology Conference : The Lords of the IMS - Expanding the Frontiers of Metrology Innovations - Grand Millennium Auckland , Auckland, Seland Newydd
    Hyd: 20 Mai 201923 Mai 2019
    https://i2mtc2019.ieee-ims.org/

    Cyfres gyhoeddiadau

    Enw
    ISSN (Electronig)2642-2077

    Cynhadledd

    Cynhadledd2019 IEEE International Instrumentation & Measurement Technology Conference
    Teitl crynoIEEE I2MTC 2019
    Gwlad/TiriogaethSeland Newydd
    DinasAuckland
    Cyfnod20/05/1923/05/19
    Cyfeiriad rhyngrwyd

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