This paper outlines the design and development of a microprocessor controlled A. T. E. for an automatic washing machine. A large section of the work involved designing a high level test language to provide the test engineer with the facility to alter program parameters. Its format is such that any system under test requiring both analog and digital monitoring can be accommodated.
|Automatic Testing & Test and Measurement Exhibition 83, Conference Proceedings. Session 5: Production Testing and Testability.; Wiesbaden, W Ger; ; Code 5054
|Network Exhibitions Ltd
|Nifer y tudalennau
|Cyhoeddwyd - 1 Rhag 1983