Low Cost Microprocessor Controlled A.T.E. for White Consumer Products Testing

Hefin Rowlands; J. Hywel Williams

Low Cost Microprocessor Controlled A.T.E. for White Consumer Products Testing

Hefin Rowlands^*, J. Hywel Williams

^*Awdur cyfatebol y gwaith hwn

Allbwn ymchwil: Pennod mewn Llyfr/Adroddiad/Trafodion Cynhadledd › Cyfraniad i gynhadledd › adolygiad gan gymheiriaid

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This paper outlines the design and development of a microprocessor controlled A. T. E. for an automatic washing machine. A large section of the work involved designing a high level test language to provide the test engineer with the facility to alter program parameters. Its format is such that any system under test requiring both analog and digital monitoring can be accommodated.

Iaith wreiddiol	Saesneg
Teitl	Automatic Testing & Test and Measurement Exhibition 83, Conference Proceedings. Session 5: Production Testing and Testability.; Wiesbaden, W Ger; ; Code 5054
Cyhoeddwr	Network Exhibitions Ltd
Tudalennau	49-54
Nifer y tudalennau	6
ISBN (Argraffiad)	0907634176
Statws	Cyhoeddwyd - 1 Rhag 1983

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@inproceedings{25b514f0eea246ebb571fb911e8d30fc,

title = "Low Cost Microprocessor Controlled A.T.E. for White Consumer Products Testing",

abstract = "This paper outlines the design and development of a microprocessor controlled A. T. E. for an automatic washing machine. A large section of the work involved designing a high level test language to provide the test engineer with the facility to alter program parameters. Its format is such that any system under test requiring both analog and digital monitoring can be accommodated.",

author = "Hefin Rowlands and Williams, {J. Hywel}",

year = "1983",

month = dec,

day = "1",

language = "English",

isbn = "0907634176",

pages = "49--54",

booktitle = "Automatic Testing & Test and Measurement Exhibition 83, Conference Proceedings. Session 5: Production Testing and Testability.; Wiesbaden, W Ger; ; Code 5054",

publisher = "Network Exhibitions Ltd",

}

Low Cost Microprocessor Controlled A.T.E. for White Consumer Products Testing. / Rowlands, Hefin; Williams, J. Hywel.

Automatic Testing & Test and Measurement Exhibition 83, Conference Proceedings. Session 5: Production Testing and Testability.; Wiesbaden, W Ger; ; Code 5054. Network Exhibitions Ltd, 1983. t. 49-54.

Allbwn ymchwil: Pennod mewn Llyfr/Adroddiad/Trafodion Cynhadledd › Cyfraniad i gynhadledd › adolygiad gan gymheiriaid

TY - GEN

T1 - Low Cost Microprocessor Controlled A.T.E. for White Consumer Products Testing

AU - Rowlands, Hefin

AU - Williams, J. Hywel

PY - 1983/12/1

Y1 - 1983/12/1

N2 - This paper outlines the design and development of a microprocessor controlled A. T. E. for an automatic washing machine. A large section of the work involved designing a high level test language to provide the test engineer with the facility to alter program parameters. Its format is such that any system under test requiring both analog and digital monitoring can be accommodated.

AB - This paper outlines the design and development of a microprocessor controlled A. T. E. for an automatic washing machine. A large section of the work involved designing a high level test language to provide the test engineer with the facility to alter program parameters. Its format is such that any system under test requiring both analog and digital monitoring can be accommodated.

M3 - Conference contribution

AN - SCOPUS:0020871146

SN - 0907634176

SP - 49

EP - 54

BT - Automatic Testing & Test and Measurement Exhibition 83, Conference Proceedings. Session 5: Production Testing and Testability.; Wiesbaden, W Ger; ; Code 5054

PB - Network Exhibitions Ltd

ER -

Low Cost Microprocessor Controlled A.T.E. for White Consumer Products Testing

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